Analysis Equipment Product List and Ranking from 20 Manufacturers, Suppliers and Companies | IPROS
Last Updated： Aggregation Period:Jun 03, 2026～Jun 30, 2026
This ranking is based on the number of page views on our site.
Analysis Equipment Manufacturer, Suppliers and Company Rankings
Last Updated： Aggregation Period:Jun 03, 2026～Jun 30, 2026
This ranking is based on the number of page views on our site.
- 日本カンタム・デザイン Tokyo//Government
- 東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州） Kanagawa//Building materials, supplies and fixtures manufacturers
- ローデ・シュワルツ・ジャパン Tokyo//others
- 4 サンライズ工業 Niigata//Building materials, supplies and fixtures manufacturers
- 4 オーイーエム 本社（大阪）、品川オフィス Osaka//Service Industry
Analysis Equipment Product ranking
Last Updated： Aggregation Period:Jun 03, 2026～Jun 30, 2026
This ranking is based on the number of page views on our site.
- Nanoparticle analysis device NanoSight 日本カンタム・デザイン
- VAM analysis device 東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
- Biomolecular Interaction Analysis Device "QCM Sensor System" サンライズ工業
- DDR3 Data Eye Diagram Test ローデ・シュワルツ・ジャパン
- 4 Calibration of measuring instrument Power Analyzer 3390 <HIOKI/Hioki Electric> オーイーエム 本社（大阪）、品川オフィス
Analysis Equipment Product List
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Analysis of the assembly joint of the component.
By applying chemical etching, ion milling, and FIB processing to mechanical polishing methods, we will analyze various metal joints, starting with lead-free solder.
The joints of electronic components have a significant impact on the overall reliability of the circuit board. Particularly at solder joints, not only the shape but also the observation of the metal structure becomes important.
- Company：アイテス
- Price：Other
The state of analysis techniques, starting with the failure analysis of bonding, adhesion, and assembly parts.
Introducing the perspectives from which analysis and analytical techniques should be advanced!
Our company supports customers in solving their challenges and problems not only with electronic components but also with a wide range of products, parts, and materials, including inorganic and organic materials, through failure analysis, defect analysis, structural analysis, and reliability evaluation. This document introduces how to approach analysis and evaluation techniques from various perspectives. We hope it serves as a starting point and a helpful resource for our customers in resolving issues. [Contents] ■ Introduction ■ Image of Joining and Positioning of Our Evaluation and Analysis Techniques ■ Causes of Defects ■ Methods ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
![[Data] Examples of Issues and Analysis of Solar Cells](https://image.www.ipros.com/public/product/image/8ac/2000477851/IPROS65825463468471618599.png?w=280&h=280)
[Data] Examples of Issues and Analysis of Solar Cells
We are publishing examples of defect analysis and analysis conducted through various approaches!
This document introduces the defects of solar cell modules and presents cases where various cross-sectional analyses were conducted for observation and analysis, along with the factors contributing to degradation. It includes an introduction to the "basic structure of solar cells" as well as "non-destructive analysis and destructive analysis," using diagrams and photographs. We encourage you to read it. 【Contents】 ■ Introduction ■ Basic Structure of Solar Cells ■ Non-Destructive Analysis and Destructive Analysis ■ Various Defect Modes ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
Crystal analysis by EBSD BGA
The EBSD method allows for the estimation of crystal states and residual stresses! Here is an example of BGA analysis.
Here is an example of BGA (Ball Grid Array) analysis. For observation using a microscope, both optical microscopy and SEM are employed. In crystal analysis using the EBSD method, we utilize Phase maps, Sn Grain maps, Sn IPF maps, and Sn GROD maps, which allow for the inference of crystal states and residual stresses. [Overview] ■ Crystal analysis using the EBSD method - Phase map - Sn Grain map - Sn IPF map - Sn GROD map *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
OBIRCH analysis of SiC devices using short-wavelength lasers.
Since semiconductors have different physical properties, new methods are required for failure analysis!
Our company conducts OBIRCH analysis of SiC devices using short-wavelength lasers. SiC is a power device with lower energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In the backside OBIRCH analysis of SiC-SBD using short-wavelength lasers, localized melting damage was induced in the SiC Schottky barrier diode, resulting in the generation of a pseudo-leak. Locations of pseudo-leaks that could not be confirmed in the IR-OBIRCH analysis were clearly observed in the GL-OBIRCH analysis. *For more details, please refer to the PDF materials or feel free to contact us.
- Company：アイテス
- Price：Other
Identification of failure points in electronic components through thermal analysis.
It is possible to perform non-destructive testing from fault location identification to internal observation! High-precision identification of heat generation areas can be achieved.
Thermal analysis is a method for identifying defective areas by detecting the heat generated at leak points due to applied voltage using a high-sensitivity InSb camera. By detecting the weak heat generated from shorts and leaks with a high-sensitivity InSb camera, it is possible to non-destructively identify the failure points of electronic components such as semiconductors. Furthermore, non-destructive observation can also be performed using X-ray inspection equipment. 【Features】 ■ Identifying defective areas by detecting the heat generated at leak points with a high-sensitivity InSb camera ■ Analyzing samples in a non-destructive state, and analyzing electronic components that are difficult to analyze with OBIRCH or emission methods is also possible ■ By using the lock-in function to obtain phase information, it is possible to accurately identify the heat generation points *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
![[Data] Power Control Loop Response Measurement (Bode Plot)](https://image.www.ipros.com/public/product/image/418/2000463117/IPROS82752168597206945085.jpeg?w=280&h=280)
[Data] Power Control Loop Response Measurement (Bode Plot)
About the measurement of power control loop response! Includes injection points and probing, etc.
The oscilloscope is a key measurement tool for engineers to test/evaluate power supply designs today. By adding the "R&S RTx-K36 Frequency Response Analysis (Bode Plot) Option," it can also be used as a low-cost alternative to low-frequency network analyzers or dedicated standalone frequency analyzers. This document provides detailed information on topics such as "Injection Points and Probing," "Device Settings," and "Measurement Results." [Contents] ■ Challenges ■ Rohde & Schwarz Solutions ■ Measurement Setup ■ Summary *For more details, please refer to the PDF document or feel free to contact us.
- Company：ローデ・シュワルツ・ジャパン
- Price：Other
Biomolecular Interaction Analysis Device "QCM Sensor System"
Applicable to sensing specific molecules in fields such as life sciences, food chemistry, and environmental science.
The QCM sensor system (Quartz Crystal Microbalance) is a biosensing system that utilizes the piezoelectric effect of quartz crystals. It can be applied to the sensing of specific molecules in fields such as life sciences, food chemistry, and environmental science. It can measure minute mass changes on the order of picograms occurring on the QCM sensor. 【Features】 ○ Dynamic analysis is possible → Other methods (such as SPR and ELISA) only provide results after binding is complete → With dynamic analysis, it is possible to analyze the properties of biomolecules such as binding constants, dissociation constants, inhibition constants, and binding rates. For more details, please contact us or download the catalog.
- Company：サンライズ工業
- Price：Other
Tohoku University Technology: Autism Spectrum Marker: T14-105
By examining the father's samples, it is possible to predict the incidence of autism spectrum disorder in children.
Autism spectrum disorder is a group of developmental disorders characterized by qualitative abnormalities in social interaction, qualitative abnormalities in communication, and restricted interests and repetitive behavior patterns. It has been reported that the higher the age of the father at the time of having children, the higher the incidence of autism spectrum disorder in children. The inventors have confirmed that the older the wild-type father mice are, the higher the methylation level of H3K79me3 in the offspring mice, and that the higher this level is, the more significant the reduction in ultrasonic vocalizations (USV), which are considered model behaviors in autism spectrum disorder model mice.
- Company：Tohoku Techno Arch Co., Ltd.
- Price：Other
1,400fps high sampling motion analysis system Qualisys
Reliable tracking with high-speed sampling【Arqus A5】
The Qualisys motion capture system, the Arqus A5, supports high-speed sampling measurements at an industry-leading 1,400 fps. Additionally, by adjusting the field of view, it can be configured to a maximum of 10,000 fps. It also features unique technologies such as the Active Filter for outdoor use and IP67 waterproof and dustproof capabilities, allowing it to be used in measurement targets and environments that were previously impossible for conventional motion capture systems.
- Company：アーカイブティップス 本社
- Price：Other
Acoustic Analysis Device "MAC-784"
It is possible to collect and analyze generated sounds such as friction sounds and echo sounds to evaluate the characteristics of the work!
The MAC-784 is an acoustic analysis device that allows for the evaluation of work characteristics by collecting and analyzing generated sounds. By analyzing friction sounds and echo sounds, it enables the evaluation of work characteristics. Various processes such as analysis, waveform extraction, waveform combination, comparison, and filtering are possible. 【Features】 ■ Enables evaluation of work characteristics (such as hardness and density) through the analysis of friction sounds and echo sounds. ■ Various processes are possible, including analysis (time series data, power spectrum, color map, octave), waveform extraction, waveform combination, comparison, and filtering. ■ In addition to software, devices (mechanical and control) tailored to the work can be designed and manufactured. *For more details, please refer to the PDF materials or feel free to contact us.
- Company：松浦電弘社
- Price：Other
VAM analysis device
The loaded data can be analyzed using analysis software for conditional searches and trigger searches, which helps reduce analysis time.
We would like to introduce the "VAM Analysis Device," which allows for reading and data analysis of memory data from the Information Memory (VAM)/VAM32/VAM32II. The I/F unit used for reading the Information Memory (VAM) has been significantly compacted compared to the conventional Information Memory (VAM) reader (SD42243-01), making it even easier to carry. Our company leverages the technology developed for selecting LEDs and circuit board layout in railway signal and display devices for development design and manufacturing (prototype mass production). We can solve your problems such as "I want this type of alarm" or "Can you make something like this with LEDs?" so please feel free to contact us. 【Features】 ■ The power supply for the I/F unit is provided by the computer, so no separate AC power supply is needed. ■ The read data can be analyzed using software for conditional searches and trigger searches, which helps reduce analysis time. ■ The contents of the data and search results can be saved in CSV file format. *For more details, please download the PDF or feel free to contact us.
- Company：東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
- Price：Other
Non-destructive sound analysis device "NEW EVOTIS"
A waveform acquisition display and waveform analysis device equipped with both impact force inspection and acoustic inspection functions.
The "NEW EVOTIS" is a non-destructive impact sound analysis device that allows for various customizations. This product is primarily intended for research and development purposes, such as human-based waveform feature extraction and parameter setting considerations. However, it also enables on-site judgment of quality while observing waveforms (with LED display and alarm buzzer on the panel surface). Please feel free to contact us if you have any requests. 【Features】 ■ Equipped with an acoustic microphone near the impact hammer to capture the waveform of the impact force and the acoustic waveform from the microphone. ■ The acquired waveforms are transferred to a computer and displayed on the same screen. ■ Waveforms can be displayed in real-time and stored within the computer, with retrieved data capable of being overlaid on the computer screen in up to eight different colors. *For more details, please download the PDF or feel free to contact us.
- Company：シスミック
- Price：Other
Ultra-compact spectral phase and intensity measurement analysis device (LX-SPIDER)
Smaller than a laptop and portable anywhere, easy alignment with automatic calibration feature.
The LX-SPIDER is a device that uses the SPIDER method for phase and intensity measurement of ultra-fast lasers, enabling single-shot measurements and real-time phase measurement and analysis. It is ultra-compact, easy to align, and equipped with an automatic calibration function. Features: ● Wavelength range: 750~900nm ● Pulse width: Optical set 1... 16~150fs Optical set 2... 70~300fs ● Measures spectral phase, intensity, and temporal intensity of Ti:Sa lasers to check performance ● Single-shot measurement ● Real-time analysis ● Equipped with automatic calibration function, no adjustment required upon delivery
- Company：フォトテクニカ
- Price：Other
Nanoparticle analysis device NanoSight
Optimal for measuring the particle size and number concentration distribution of exosomes (extracellular vesicles / EVs) and ultrafine bubbles (nano-sized bubbles / UFB)!
The new model, NanoSight Pro, was released in September 2023, transitioning from the NS300! Please take a look at the product details! For information on NanoSight Pro, click here: Ipros site: https://www.ipros.jp/product/detail/2001025622 NanoSight allows real-time observation of the Brownian motion of nanoparticles in liquid on a PC screen using NTA (Nanoparticle Tracking Analysis) technology. By analyzing the Brownian motion of the particles, you can obtain graphs of particle size and number concentration distribution.
- Company：日本カンタム・デザイン
- Price：Other
Efficiently evaluate the performance of spray nozzles through contracted analysis, leading to problem-solving!
We present materials that visualize the performance of spray nozzles through analyses related to nozzle performance, such as fluid analysis, particle size measurement, and collision force distribution, along with examples of analysis and evaluation.
The performance of spray nozzles is influenced by factors such as pressure, flow rate, spray pattern, particle size, flow velocity, flow distribution, and impact force distribution. Everloy possesses the measurement equipment and analytical evaluation techniques for these factors and has conducted numerous analyses to date. Based on years of accumulated experiments and analytical evaluations, we can propose optimization plans for spray nozzles tailored to our customers' intended use. Customers in need of analysis are welcome to consult us freely.
- Company：共立合金製作所 / 総代理店 エバーロイ商事株式会社
- Price：Other
Failure analysis of power devices
We will identify and observe the defective areas of power devices such as diodes, MOS-FETs, and IGBTs.
We perform optimal preprocessing for power devices such as diodes, MOS FETs, and IGBTs of all sizes and shapes, and identify and observe defective areas through backside IR-OBIRCH analysis and backside emission analysis. ■ Preprocessing for Analysis - Backside Polishing - Supports various sample forms. Si chip size: 200um to 15mm square ■ Defective Area Identification - Backside IR-OBIRCH Analysis / Backside Emission Analysis - IR-OBIRCH Analysis: Supports up to 100mA/10V and 100uA/25V Emission Analysis: Supports up to 2kV * Covers a wide range of defect characteristics such as low-resistance shorts, micro-leaks, and high-voltage breakdown failures. ■ Pinpoint Cross-Section Observation of Leak Areas - SEM/TEM - Select SEM or TEM observation based on the predicted defects, allowing for pinpoint physical observation and elemental analysis of leak defect areas.
- Company：アイテス
- Price：Other
![[Example of Analysis by EBSD] Chip](https://image.www.ipros.com/public/product/image/9e0/2000533345/IPROS08836877231324882336.png?w=280&h=280)
[Example of Analysis by EBSD] Chip
I will introduce an example of analysis using EBSD where orientation was observed in the Al wiring.
We will introduce an example of analysis of chip surface wiring (Al) using EBSD. The package resin was opened using a chemical solution/RIE, and an analysis of the Al pattern on the chip surface was conducted using EBSD. As a result, orientation was observed in the Al wiring. The normal orientation is distributed, suggesting the presence of many crystals. 【Overview】 ■ Analysis Method - The package resin was opened using a chemical solution/RIE. - An analysis of the Al pattern on the chip surface was conducted using EBSD. ■ Results - Orientation was observed in the Al wiring. *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
![[Example of analysis using EBSD] Via](https://image.www.ipros.com/public/product/image/530/2000533380/IPROS80267660547364406939.png?w=280&h=280)
[Example of analysis using EBSD] Via
The EBSD method allows for the estimation of crystal size distribution and residual stress.
We will introduce an example of analysis using EBSD for vias (Cu) formed in laminated substrates. The EBSD method allows for the estimation of crystal size distribution and residual stress. Additionally, by highlighting on the map, the features that appear in the graph can be visualized. [Overview] ■Observation of crystal structure using EBSD ・IPF map ・GROD map ・Crystal grain distribution map *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
Backside light emission analysis of SiC devices
Pre-processing of SiC devices → Identification of leakage points → Physical analysis/component analysis handled seamlessly!
Our company conducts "Backside Emission Analysis of SiC Devices." SiC is a power device that has less energy loss compared to conventional Si semiconductors and is attracting attention. However, since its physical properties differ from those of Si semiconductors, new methods are required for failure analysis. In a case study of backside emission analysis of SiC MOSFETs, an overseas SiC MOSFET was subjected to ESD, creating a G-(D,S) leakage, and numerous emissions indicating the leakage points were detected through emission analysis. When the emission points were observed using TEM, damage to the SiO2 film and the SiC crystal was noted. *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
Example of analysis using EBSD (ceramics)
Examples of analysis using EBSD will be introduced, such as 'Observation/Elemental Analysis' and 'Analysis by EBSD'!
We will introduce an example of analysis using EBSD for ceramic (Al2O3). In the "Observation/Elemental Analysis," it was determined to be Al2O3 based on elemental analysis using EDX, and it was observed that Si was scattered as shown in the map. In the "Analysis using EBSD," the distribution of crystal size and orientation can be confirmed using the EBSD method, and by highlighting on the map, the features that appeared in the graph can be visualized. [Analysis Overview] ■ Observation/Elemental Analysis - Observation using SEM and elemental analysis using EDX ■ Analysis using EBSD - Observation of crystal structure using EBSD *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
![[Data] Whisker Analysis by EBSD](https://image.www.ipros.com/public/product/image/dcb/2000552755/IPROS61764853026228393387.png?w=280&h=280)
[Data] Whisker Analysis by EBSD
Introducing a case study analyzing whiskers that occurred on the lead terminals of an IC package!
This document introduces a case study on whiskers that occurred on the lead terminals of IC packages, where cross-sections were created through mechanical polishing, followed by SEM observation and EBSD analysis. It includes surface SEM images of the IC package as well as cross-sectional SEM images. It is evident that the crystal grains and grain boundaries measured by the EBSD method are consistent. We invite you to read it. 【Published Case Studies】 ■Observation/Cross-section preparation ■Analysis using EBSD *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
Crystal analysis by EBSD: Aluminum weld joint (spot welding)
We will introduce an analysis example confirming that the welded area has a large distribution of grain crystals.
As an example of EBSD, we conducted an analysis of the cross-section of an aluminum welding joint from the cross-sectional direction, and we would like to introduce it. For a sample where an aluminum plate was spot-welded to an aluminum case, we prepared a cross-section of the weld and performed EBSD analysis. In the distribution of grain sizes, it was confirmed that the weld area has a larger number of large grains compared to the base material. [Analysis Overview] ■ Visualization of Grain Structure - It can be seen that the shape and size of the grains in the weld area differ from those in the base material. ■ Distribution of Grain Sizes - It is confirmed that the weld area has a greater distribution of large grains compared to the base material. *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
Example of analysis using EBSD: Silicon wafer
The measured silicon wafer is single crystal! The IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes.
Here is a case study of a silicon wafer analyzed using EBSD. A small piece was cut from the wafer, and an IPF map was obtained for a central area of 50×50 μm. The measurement area shows red, indicating the {001} plane, and the absence of grain boundaries confirms that it is a single crystal. Since the measured silicon wafer is a single crystal, the IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes. *For more details, please refer to the PDF document or feel free to contact us.*
- Company：アイテス
- Price：Other
DDR3 Data Eye Diagram Test
Significantly reduce the time required for analyzing signal integrity conditions!
Compliance testing is essential to ensure that the timing, slew rate, and voltage levels of Dynamic Random Access Memory (DRAM) signals conform to specifications. By utilizing eye diagram testing, the time required for analyzing signal integrity conditions can be significantly reduced, allowing for quick inspection of signal quality. The following challenges are addressed by the "DDR3 Data Eye Diagram Test": [Challenges] ■ Lack of flexibility to quickly debug signal integrity issues ■ Need for separation of read/write operations ■ Overlapping of consecutive bits within a data burst for testing based on a simple mask *For more details, please refer to the PDF document or feel free to contact us.
- Company：ローデ・シュワルツ・ジャパン
- Price：Other
What is motion capture? - Three-dimensional motion analysis device -
Quantifying people and things
What is a three-dimensional motion measurement device/motion capture? We introduce everything from the principles of motion capture to the features of the Qualisys system. □ What is motion capture? The principles of the Qualisys motion capture system. https://archivetips.com/qualisys/mocap-knowhow
- Company：アーカイブティップス 本社
- Price：Other
Multi-function analysis device "DAB8000 mini series"
U-SDI standard update support! We provide seamless monitoring by minimizing processing delays.
The "DAB8000 mini series" is an all-in-one analysis device for the development of 8K equipment that fully supports the UHDTV (BT.2020) standard. With a UHDTV-compatible waveform monitor, it allows for real-time analysis and the simultaneous confirmation of multiple waveforms. By minimizing processing delays through dedicated hardware analysis, it provides seamless monitoring. 【Features】 ■ For video ■ All-in-one ■ Fully supports UHDTV (BT.2020) standard ■ Compatible with U-SDI standard updates ■ Real-time analysis with the ability to confirm multiple waveforms simultaneously *For more details, please refer to the PDF document or feel free to contact us.
- Company：日本コントロールシステム
- Price：Other
VAM Analysis Device <iOS Compatible Version>
In addition to reading VAM data, settings and monitoring are possible! The read data can be sent via email and analyzed on a PC.
We would like to introduce our iOS-compatible "VAM Analysis Device." By connecting this device, you can analyze the VAM and VAM32 series using an iPad. The connection is made through the interface unit, and communication between the iPad and the interface unit is done via Bluetooth (BLE). Our company utilizes the technology developed through our experience with signal and display devices for railways to select LEDs and design circuit layouts, enabling us to carry out development design and manufacturing (prototype and mass production). We can solve your problems, such as "I want this type of alarm" or "Can you create something like this with LEDs?" so please feel free to contact us. 【Features】 ■ Analysis of VAM and VAM32 series using an iPad ■ Ability to read VAM data, as well as settings and monitoring ■ The read VAM data can be sent via email and analyzed on a computer in the office *For more details, please download the PDF or feel free to contact us.
- Company：東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
- Price：Other
